DocumentCode :
2217265
Title :
Modeling and simulation of real defects using fuzzy logic
Author :
Attarha, Amir ; Nourani, Mehrdad ; Lucas, Caro
Author_Institution :
The Univ. of Texas
fYear :
2000
fDate :
2000
Firstpage :
631
Lastpage :
636
Keywords :
Circuit faults; Circuit simulation; Circuit testing; Electrical fault detection; Fabrication; Fault detection; Fuzzy logic; Semiconductor device modeling; Very large scale integration; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2000. Proceedings 2000
Print_ISBN :
1-58113-187-9
Type :
conf
DOI :
10.1109/DAC.2000.855389
Filename :
855389
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2217265
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