Uncover the diffusion mechanism of atoms during electromigration test using non-stationary noise analysis

Author

Lim, Shin Yeh ; Tan, Cher Ming ; Krishnamachar, Prasad ; Zhang, Dao Hua

Author_Institution

Sch. of Electron. & Electr. Eng., Nanyang Technol. Univ., Singapore, Singapore

Volume

2

fYear

2001

fDate

22-25 Oct. 2001

Firstpage

942

Abstract

A non-stationary signal processing method - smoothed pseudo Wigner-Ville distribution (SPWD) is employed to investigate the frequency exponent variation and frequency characteristic trend of the electromigration noise. Comparison of the results by both the stationary signal processing tool-Fourier transform and SPWD-will be presented. It is found that the non-stationary analysis is more suitable in interpreting the noise of highly dynamic process like electromigration.

Keywords

electromigration; integrated circuit interconnections; integrated circuit noise; integrated circuit reliability; atom diffusion mechanism; dynamic process; electromigration noise; electromigration test; frequency exponent; nonstationary noise analysis; signal processing; smoothed pseudo Wigner-Ville distribution; Atomic measurements; Electromigration; Fourier transforms; Frequency estimation; Noise measurement; Signal analysis; Signal processing; Testing; Time frequency analysis; Ultra large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State and Integrated-Circuit Technology, 2001. Proceedings. 6th International Conference on

Print_ISBN

0-7803-6520-8

Type

conf

DOI

10.1109/ICSICT.2001.982050

Filename

982050