DocumentCode :
2217813
Title :
Numerical evaluation of Near-Field to Far-Field transformation robustness for EMC
Author :
Radchenko, Andriy ; Zhang, Ji ; Kam, Keong ; Pommerenke, David
Author_Institution :
EMC Lab., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
fYear :
2012
fDate :
6-10 Aug. 2012
Firstpage :
605
Lastpage :
611
Abstract :
Near-Field (NF) to Far-Field (FF) transformation techniques are widely used for antenna radiation problems. To perform a NF to FF or a NF to NF transformation for EMC applications, the large frequency range, and a weak signals will require data in the reactive near field. In principle, the transformation can be performed if all sources are confined in the scanned area using Huygens´ Principle, which requires knowledge of the exact phase and magnitude data of measured fields. In reality, this cannot be achieved, due to uncertainties in the field probe measurements, presence of active and passive cables and limited scan areas. Thus, it is attempted to perform a transformation based on an incomplete and uncertain data set. Results of a numerical simulation tool usage for NF to FF transformation based on NF-Scanning system measured data are demonstrated.
Keywords :
antenna radiation patterns; cables (electric); electromagnetic compatibility; numerical analysis; EMC; FF transformation techniques; Huygens principle; NF transformation techniques; NF-scanning system; active cables; antenna radiation problems; far-field transformation technique; field probe measurements; near-field transformation technique; numerical evaluation; numerical simulation; passive cables; Dynamic range; Electric fields; Electromagnetic compatibility; Integrated circuits; Magnetic field measurement; Noise measurement; Probes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (EMC), 2012 IEEE International Symposium on
Conference_Location :
Pittsburgh, PA
ISSN :
2158-110X
Print_ISBN :
978-1-4673-2061-0
Type :
conf
DOI :
10.1109/ISEMC.2012.6351692
Filename :
6351692
Link To Document :
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