DocumentCode
2217838
Title
Perturbation of near-field scan from connected cables
Author
Sorensen, Matthew ; Franek, Ondrej ; Pedersen, Gert F. ; Baltsen, K.A. ; Ebert, H.
Author_Institution
Dept. of Electron. Syst., Aalborg Univ., Aalborg, Denmark
fYear
2012
fDate
6-10 Aug. 2012
Firstpage
594
Lastpage
599
Abstract
The perturbation of near-fields scan from connected cables are investigated and how to handle the cables is discussed. A connected cable induced small but theoretical detectable changes in the near-field. This change can be seen in Huygens´ box simulations (equivalent source currents on a box) at the cable resonance frequencies while there is no change away from the resonance frequencies.
Keywords
electromagnetic compatibility; electromagnetic interference; telecommunication cables; EMI-EMC; Huygens box simulations; cable resonance frequency; connected cables; near-field scan perturbation; Magnetic field measurement; Magnetic fields; Measurement uncertainty; Power cables; Predictive models; Resonant frequency; Surface impedance;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (EMC), 2012 IEEE International Symposium on
Conference_Location
Pittsburgh, PA
ISSN
2158-110X
Print_ISBN
978-1-4673-2061-0
Type
conf
DOI
10.1109/ISEMC.2012.6351694
Filename
6351694
Link To Document