DocumentCode :
2217843
Title :
Closing the gap between analog and digital
Author :
Saab, Khaled ; Hamida, N.B. ; Kaminska, Bozena
Author_Institution :
Fluence Technology Inc.
fYear :
2000
fDate :
2000
Firstpage :
774
Lastpage :
779
Keywords :
Analog circuits; Automatic testing; Benchmark testing; Circuit faults; Circuit simulation; Circuit testing; Digital circuits; Integrated circuit testing; Permission; Signal generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2000. Proceedings 2000
Print_ISBN :
1-58113-187-9
Type :
conf
DOI :
10.1109/DAC.2000.855418
Filename :
855418
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2217843
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