Title :
A novel algorithm to extract two-node bridges
Author :
Zachariah, Sujit T. ; Chakravarty, Sreejit ; Roth, Carl D.
Author_Institution :
Intel Corporation
Keywords :
Algorithm design and analysis; Bridge circuits; Circuit faults; Circuit testing; Data mining; Integrated circuit modeling; Integrated circuit testing; Microprocessors; Permission; Statistical analysis;
Conference_Titel :
Design Automation Conference, 2000. Proceedings 2000
Print_ISBN :
1-58113-187-9
DOI :
10.1109/DAC.2000.855421
