DocumentCode :
2218278
Title :
Flexible access to MCM technology via the multichip module designers´ access service (MIDAS)
Author :
Peltier, Jennifer ; Hansford, Wes
Author_Institution :
MIDAS Service, Information Sci. Inst., Marina del Rey, CA, USA
fYear :
1996
fDate :
6-7 Feb 1996
Firstpage :
86
Lastpage :
88
Abstract :
The MCM Designers´ Access Service (MIDAS) allows designers to obtain prototype and small quantities of MCMs. The service currently maintains relationships with several MCM-D foundries, including: nChip in San Jose, CA; Micromodule Systems (MMS) in Cupertino, CA; and IBM Microelectrons in Hopewell Junction, NY. MIDAS provides a low-cost service achieved through a multi-project environment where the customers share tooling and substrate manufacturing costs. The service offers design support, distributes foundry design kits, groups the projects onto regularly scheduled runs, places orders, and supplies fully assembled modules. As well, MIDAS offers a limited selection of open-tooled, second-level packages, bare tested die (KGD), and test sockets. MIDAS functions as a technology enabler by supplying the designer with an interface “transparent” to the fabricator and common to multiple vendors. Foundries prefer to work with a single source who coordinates the details of user interactions. Thus, they avoid dealing with multiple customers and spare valuable overhead. The service operates on an on-going basis and has delivered modules to customers from each foundry. Commercial, military and educational/research institutions utilize the service. This paper discusses the background and current status of MIDAS. Additionally, plans for accessing mixed signal MCM technologies and flip chip bumping and assembly are reviewed
Keywords :
flip-chip devices; integrated circuit design; integrated circuit manufacture; microassembling; multichip modules; MCM Designer Access Service; MCM technology; MIDAS; bare tested die; flip chip assembly; flip chip bumping; mixed signal MCM technologies; multichip module design; open-tooled second-level packages; test sockets; Assembly; Costs; Foundries; Job shop scheduling; Manufacturing; Multichip modules; Packaging; Prototypes; Sockets; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Multi-Chip Module Conference, 1996. MCMC-96, Proceedings., 1996 IEEE
Conference_Location :
Santa Cruz, CA
Print_ISBN :
0-8186-7286-2
Type :
conf
DOI :
10.1109/MCMC.1996.510774
Filename :
510774
Link To Document :
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