Determination of the propagation constant of coupled lines on chips based on high frequency measurements

Author

Winkel, Thomas-Michael ; Dutta, Lohit Sagar ; Grabinski, Hartmut ; Groteluschen, Enno

Author_Institution

Lab. fur Informationtechnologie, Hannover Univ., Germany

fYear

1996

fDate

6-7 Feb 1996

Firstpage

99

Lastpage

104

Abstract

A new method has been developed to determine the propagation constant of symmetrical coupled lossy lines. The results are based on high frequency measurements of the scattering parameters of only two coupled two line systems of different lengths. The mathematical derivation of the method is be given. The proposed method is related to an eigenvalue calculation. Results obtained from measurements are presented and discussed. A comparison between the measured and calculated results is given and shows excellent agreement

Keywords

S-parameters; UHF measurement; eigenvalues and eigenfunctions; integrated circuit packaging; microwave measurement; multichip modules; transmission line theory; HF measurements; coupled transmission lines; eigenvalue calculation; propagation constant; scattering parameters; symmetrical coupled lossy lines; Frequency measurement; Integrated circuit interconnections; Integrated circuit measurements; Length measurement; Performance evaluation; Propagation constant; Propagation losses; Semiconductor device measurement; Silicon; Substrates;

fLanguage

English

Publisher

ieee

Conference_Titel

Multi-Chip Module Conference, 1996. MCMC-96, Proceedings., 1996 IEEE

Conference_Location

Santa Cruz, CA

Print_ISBN

0-8186-7286-2

Type

conf

DOI

10.1109/MCMC.1996.510777

Filename

510777