Title :
Determination of the propagation constant of coupled lines on chips based on high frequency measurements
Author :
Winkel, Thomas-Michael ; Dutta, Lohit Sagar ; Grabinski, Hartmut ; Groteluschen, Enno
Author_Institution :
Lab. fur Informationtechnologie, Hannover Univ., Germany
Abstract :
A new method has been developed to determine the propagation constant of symmetrical coupled lossy lines. The results are based on high frequency measurements of the scattering parameters of only two coupled two line systems of different lengths. The mathematical derivation of the method is be given. The proposed method is related to an eigenvalue calculation. Results obtained from measurements are presented and discussed. A comparison between the measured and calculated results is given and shows excellent agreement
Keywords :
S-parameters; UHF measurement; eigenvalues and eigenfunctions; integrated circuit packaging; microwave measurement; multichip modules; transmission line theory; HF measurements; coupled transmission lines; eigenvalue calculation; propagation constant; scattering parameters; symmetrical coupled lossy lines; Frequency measurement; Integrated circuit interconnections; Integrated circuit measurements; Length measurement; Performance evaluation; Propagation constant; Propagation losses; Semiconductor device measurement; Silicon; Substrates;
Conference_Titel :
Multi-Chip Module Conference, 1996. MCMC-96, Proceedings., 1996 IEEE
Conference_Location :
Santa Cruz, CA
Print_ISBN :
0-8186-7286-2
DOI :
10.1109/MCMC.1996.510777
