Title :
Realization of 100 V ultra-thin single-crystal silicon LDMOS
Author :
Asif, Ali ; Richter, Harald ; Burghartz, Joachim N.
Author_Institution :
Inst. fur Nano- und Mikroelektronische Syst., Univ. Stuttgart (INES), Stuttgart, Germany
Abstract :
Video streaming and fast processing in System-in-Foil (SiF) applications require high performance and ultra-thin (<; 20 μm), high-voltage transistors on foil. Chipfilm™ technology offers an efficient way of precisely defining the thickness of ultra-thin chips. An ultra-thin (<; 20 μm) single-crystal silicon N-LDMOS transistor is realized for Chipfilm™ technology. The device has a breakdown voltage (Vbr) of more than 100 volts. With an Ion/Ioff ratio of >;106, the drain current (Id) is ~ 4 mA for channel width (W) = 50 μm and channel length (L) = 10 μm. The process flow is fully compatible with conventional high-voltage CMOS process.
Keywords :
CMOS integrated circuits; power integrated circuits; Chipfilm technology; breakdown voltage; channel length; drain current; high-voltage CMOS process; high-voltage transistors; system-in-foil application; ultra-thin chips; ultra-thin single-crystal silicon LDMOS; ultra-thin single-crystal silicon N-LDMOS transistor; video streaming; Boron; Fabrication; Implants; Junctions; Silicon; Substrates; Transistors; Chipfilm™; Ultra-thin LDMOS; flexible electronic; system-in-foil;
Conference_Titel :
Semiconductor Conference Dresden (SCD), 2011
Conference_Location :
Dresden
Print_ISBN :
978-1-4577-0431-4
DOI :
10.1109/SCD.2011.6068720