• DocumentCode
    2218712
  • Title

    An advanced microprocessor based temperature controlled heatsink

  • Author

    Blaabjerg, Frede ; Pedersen, John K. ; Madsen, Knud Dam ; Rasmussen, Keld F.

  • Author_Institution
    Inst. of Energy Technol., Aalborg Univ., Denmark
  • fYear
    1993
  • fDate
    15-19 Nov 1993
  • Firstpage
    785
  • Abstract
    This paper describes an advanced temperature controlled heat sink which can be used both for testing of single power semiconductors and for testing of power electronic circuits such as inverters including snubbers, rectifiers, power supplies etc. The heatsink is equipped with a mounting fixture which makes it possible to mount small discrete devices as well as large power modules. The heatsink is controlled by an 8-bit microcontroller which also communicates to a host computer. The heat sink is heated by built-in heating elements and cooled by a fan. The system is air-based to obtain a flexible, mobile and low cost system. A high performance power supply controls power to the heater/cooler system. The power supply has a high power factor rectifier as AC/DC power converter with almost unity power factor and a buck converter as DC/DC power converter. Temperature is measured at five different places in the heat sink and the microcontroller can control the temperature independently in the heat sink. The heat sink operates in the temperature range of 25°-130°C with fast dynamic response. Test shows low line-side harmonics, high power factor and efficiency higher than 0.75 of the power supply. It is concluded that the controlled heat sink works well. The heat sink is integrated in a complete measurement system for power electronic components and test results on an IGBT are presented
  • Keywords
    automatic test equipment; automatic testing; heat sinks; insulated gate bipolar transistors; invertors; microcomputer applications; microcontrollers; power convertors; power supplies to apparatus; power transistors; rectifying circuits; semiconductor device testing; temperature control; 25 to 130 C; 8 bit; AC/DC power converter; DC/DC power converter; IGBT; automatic testing; buck converter; dynamic response; fan cooled; harmonics; heating elements; inverters; measurement system; microcontroller; microprocessor; power electronic circuits; power factor; power semiconductors; power supplies; rectifier; rectifiers; snubbers; temperature control; Circuit testing; Electronic equipment testing; Heat sinks; Microcontrollers; Microprocessors; Power electronics; Power supplies; Reactive power; Semiconductor device testing; Temperature control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, Control, and Instrumentation, 1993. Proceedings of the IECON '93., International Conference on
  • Conference_Location
    Maui, HI
  • Print_ISBN
    0-7803-0891-3
  • Type

    conf

  • DOI
    10.1109/IECON.1993.338981
  • Filename
    338981