DocumentCode :
2218998
Title :
Challenges in future technologies
Author :
Eshraghian, Kamran
Author_Institution :
Adelaide Univ., SA, Australia
fYear :
1996
fDate :
28 Apr-1 May 1996
Abstract :
The rapidly emerging area of Ultra High-Speed processing that underpins the transformation of new concepts into working systems necessitates for evolutionary changes in not only the technology base and the strategy for physical mapping of such systems, but also the all important issue of testability and testing. The systems that are mostly affected, and indeed in the next decade or so would require an ever increasing processing power, include real-time signal processors and image processors, computer vision, telecommunications, biomedical systems and personal interactive communicators having processing capability that far exceeds that of the present day super computers. Advances in conventional CMOS over the years have been based on device scaling. As submicron dimensions are approached, further scaling of CMOS becomes increasingly complex and fundamental limits will soon emerge. The emergence of the fifth generation of ICs will be characterized by complexities in excess of 10-20 million devices where integration of Photonics (control of photons) with that of Electronics (control of electrons), will provide the arena for creativity in this new design paradigm
Keywords :
digital integrated circuits; integrated circuit design; integrated circuit technology; integrated circuit testing; very high speed integrated circuits; biomedical systems; computer vision; design paradigm; device scaling; fifth generation ICs; image processors; physical mapping; signal processors; technology base; telecommunications; testability; ultra high-speed processing; Biomedical computing; Character generation; Computer vision; Electrons; Optical control; Photonics; Real time systems; Signal processing; System testing; Telecommunication computing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 1996., Proceedings of 14th
Conference_Location :
Princeton, NJ
ISSN :
1093-0167
Print_ISBN :
0-8186-7304-4
Type :
conf
DOI :
10.1109/VTEST.1996.510827
Filename :
510827
Link To Document :
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