Title :
The multi-configuration: A DFT technique for analog circuits
Author :
Renovell, M. ; Azais, F. ; Bertrand, Y.
Author_Institution :
Lab. d´´Inf., Robotique et Microelectronique, Montpellier, France
fDate :
28 Apr-1 May 1996
Abstract :
A Design-For-Testability (DFT) technique for analog circuits, called the Multi-Configuration technique is presented. This technique exhibits some flexibility features since different solutions are possible for its implementation. Different degrees of granularity are associated to the different solutions, corresponding to a given trade-off between implementation cost and test and/or diagnosis facilities. The multi-configuration technique is illustrated and validated on a 8th order band pass filter
Keywords :
analogue integrated circuits; band-pass filters; design for testability; integrated circuit design; integrated circuit testing; 8th order band pass filter; DFT technique; analog circuits; diagnosis facilities; multi-configuration technique; Analog circuits; Analog integrated circuits; Band pass filters; Circuit testing; Costs; Design for testability; Integrated circuit technology; Operational amplifiers; Performance evaluation; Robots;
Conference_Titel :
VLSI Test Symposium, 1996., Proceedings of 14th
Conference_Location :
Princeton, NJ
Print_ISBN :
0-8186-7304-4
DOI :
10.1109/VTEST.1996.510835
