• DocumentCode
    2219166
  • Title

    The multi-configuration: A DFT technique for analog circuits

  • Author

    Renovell, M. ; Azais, F. ; Bertrand, Y.

  • Author_Institution
    Lab. d´´Inf., Robotique et Microelectronique, Montpellier, France
  • fYear
    1996
  • fDate
    28 Apr-1 May 1996
  • Firstpage
    54
  • Lastpage
    59
  • Abstract
    A Design-For-Testability (DFT) technique for analog circuits, called the Multi-Configuration technique is presented. This technique exhibits some flexibility features since different solutions are possible for its implementation. Different degrees of granularity are associated to the different solutions, corresponding to a given trade-off between implementation cost and test and/or diagnosis facilities. The multi-configuration technique is illustrated and validated on a 8th order band pass filter
  • Keywords
    analogue integrated circuits; band-pass filters; design for testability; integrated circuit design; integrated circuit testing; 8th order band pass filter; DFT technique; analog circuits; diagnosis facilities; multi-configuration technique; Analog circuits; Analog integrated circuits; Band pass filters; Circuit testing; Costs; Design for testability; Integrated circuit technology; Operational amplifiers; Performance evaluation; Robots;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1996., Proceedings of 14th
  • Conference_Location
    Princeton, NJ
  • ISSN
    1093-0167
  • Print_ISBN
    0-8186-7304-4
  • Type

    conf

  • DOI
    10.1109/VTEST.1996.510835
  • Filename
    510835
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2219166