• DocumentCode
    22193
  • Title

    Improved Performance of 365-nm LEDs by Inserting an Un-Doped Electron-Blocking Layer

  • Author

    Wen-Yu Lin ; Tzu-Yu Wang ; Sin-Liang Ou ; Jia-Hao Liang ; Dong-Sing Wuu

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Nat. Chung Hsing Univ., Taichung, Taiwan
  • Volume
    35
  • Issue
    4
  • fYear
    2014
  • fDate
    Apr-14
  • Firstpage
    467
  • Lastpage
    469
  • Abstract
    In this letter, the ultraviolet light emitting diode (UV-LED) with an undoped Al0.23Ga0.77N electron-blocking layer (EBL) between the p-type doped Al0.23Ga0.77N EBL and last barrier was proposed. After inserting the undoped EBL, both the photoluminescence and electroluminescence (EL) characteristics of UV-LED were significantly improved. As the undoped EBL was inserted, the 365-nm UV-LED possessed 400% improvement in output power (at 19 A/cm2). However, the enhancement in output power was significantly reduced to 20% when the insertion of undoped EBL was applied for 375-nm UV-LED. In addition, the long-term reliability was enhanced efficiently with the addition of undoped EBL. After the aging test for 1032 h, it presented the 365-nm UV-LED inserted with an undoped EBL had the obvious improvements both in the characteristics of EL intensity and leakage current density.
  • Keywords
    aluminium compounds; current density; electroluminescence; leakage currents; light emitting diodes; photoluminescence; reliability; Al0.23Ga0.77N; EBL; EL; UV-LED; aging test; electroluminescence characteristics; leakage current density; long-term reliability; photoluminescence characteristics; size 365 nm; size 375 nm; time 1032 h; ultraviolet light emitting diode; undoped electron-blocking layer; Aluminum gallium nitride; Current density; Gallium nitride; Leakage currents; Light emitting diodes; Power generation; Quantum well devices; Light emitting diode (LED); electroluminescence (EL); electron-blocking layer (EBL); ultraviolet (UV);
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2014.2306711
  • Filename
    6758367