• DocumentCode
    2219450
  • Title

    Current signatures [VLSI circuit testing]

  • Author

    Gattiker, Anne E. ; Maly, Wojciech

  • Author_Institution
    Carnegie Mellon Univ., Pittsburgh, PA, USA
  • fYear
    1996
  • fDate
    28 Apr-1 May 1996
  • Firstpage
    112
  • Lastpage
    117
  • Abstract
    In this paper we demonstrate that performing IDDQ testing against a single threshold current value does not make sense. In place of the single current threshold we propose the “current signature”. A die´s current signature takes into account the relative measured level of current on all applied IDDQ vectors. Preliminary results of current signature applications are discussed as well
  • Keywords
    CMOS integrated circuits; VLSI; integrated circuit testing; IDDQ testing; VLSI circuit testing; active defects; current signature; passive defects; Circuit faults; Circuit testing; Current measurement; Performance evaluation; Semiconductor device measurement; Threshold current; Very large scale integration; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1996., Proceedings of 14th
  • Conference_Location
    Princeton, NJ
  • ISSN
    1093-0167
  • Print_ISBN
    0-8186-7304-4
  • Type

    conf

  • DOI
    10.1109/VTEST.1996.510844
  • Filename
    510844
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2219450