Title :
Embedded two-rail checkers with on-line testing ability
Author :
Metra, Cecilia ; Favalli, Michele ; Riccò, Bruno
Author_Institution :
Dipartimento di Elettronica Inf. e Sistemistica, Bologna Univ., Italy
fDate :
28 Apr-1 May 1996
Abstract :
This paper addresses the problem of the design of embedded two-rail checkers. In particular a simple additional circuit is proposed which can be used to make a two-rail checker receive all the codewords of the two-rail code, independently of which and how many codewords are produced by its driving functional block or checkers. The proposed circuit features a high online self-testing ability with respect to possible internal faults and a compact structure
Keywords :
VLSI; automatic testing; design for testability; error detection; integrated circuit testing; integrated logic circuits; logic testing; compact structure; embedded two-rail checkers; online testing ability; self-testing ability; two-rail code; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Very large scale integration;
Conference_Titel :
VLSI Test Symposium, 1996., Proceedings of 14th
Conference_Location :
Princeton, NJ
Print_ISBN :
0-8186-7304-4
DOI :
10.1109/VTEST.1996.510849
