• DocumentCode
    2219637
  • Title

    Safety computations in integrated circuits

  • Author

    Dufour, Jean-Louis

  • Author_Institution
    RAMS Dept., Matra Transp. Int., Montrouge, France
  • fYear
    1996
  • fDate
    28 Apr-1 May 1996
  • Firstpage
    169
  • Lastpage
    172
  • Abstract
    In order to ensure the safety of software-based railway control systems, MATRA TRANSPORT has developed at the beginning of the eighties an “informational redundancy” technique associating arithmetic coding and signature checking, with the adequate environment interfaces (generally fail-safe devices). Compared to traditional redundancy, the “coded processor” has the advantage of a rigorous mathematical safety demonstration, independent of the reliability of the underlying hardware, but there is an important cost to pay in terms of execution speed. One of the (strongly) desired evolutions of our systems is to have a unique centralized wayside equipment, the immediate corollary being the decentralization of inputs/outputs. In order to reach this goal, a new generation has been designed, replacing the software code calculations and the discrete numeric components used in coded input acquisition/coded output command by ASICs. Our experience shows that it is possible to perform safe computations in an ASIC, and even that in some cases ASICs are more adaptable to the safety constraints than software computations
  • Keywords
    application specific integrated circuits; automatic testing; coprocessors; error correction codes; fault tolerant computing; integrated circuit reliability; integrated circuit testing; logic testing; redundancy; ASICs; MATRA TRANSPORT; arithmetic coding; coded processor; integrated circuits; reliability; safety computations; signature checking; software-based railway control systems; Arithmetic; Control systems; Costs; Hardware; Rail transportation; Railway safety; Redundancy; Safety devices; Software design; Software safety;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1996., Proceedings of 14th
  • Conference_Location
    Princeton, NJ
  • ISSN
    1093-0167
  • Print_ISBN
    0-8186-7304-4
  • Type

    conf

  • DOI
    10.1109/VTEST.1996.510853
  • Filename
    510853