DocumentCode :
2219660
Title :
Full fault dictionary storage based on labeled tree encoding
Author :
Boppana, Vamsi ; Hartanto, Ismed ; Fuchs, Kent W.
Author_Institution :
Coordinated Sci. Lab., Illinois Univ., Champaign, IL, USA
fYear :
1996
fDate :
28 Apr-1 May 1996
Firstpage :
174
Lastpage :
179
Abstract :
The process of fault dictionary compaction can lead to a loss of information that is potentially useful in locating unmodeled failures. The focus of this paper is on developing alternative storage structures that can efficiently represent full fault dictionaries without discarding any information. We present the problem of storing the full fault dictionary storage as a labeled tree encoding problem. Two labeled trees are introduced to represent the diagnostic experiment. For the first tree, the unlabeled tree is stored using a binary string code, while the second tree is constructed so that the unlabeled tree is regular in structure, thus allowing implicit storage. Eight alternative representations based on the three label components are presented and two existing full fault dictionary representations (the matrix and the list dictionaries) are shown to be special cases in our general framework. Experimental results on the ISCAS 85 and ISCAS 89 circuits are used to study and characterize the performance of the proposed storage structures
Keywords :
VLSI; automatic testing; circuit analysis computing; digital storage; encoding; fault diagnosis; fault trees; integrated circuit testing; logic testing; binary string code; fault dictionary compaction; full fault dictionary storage; implicit storage; labeled tree encoding; Circuit faults; Combinational circuits; Compaction; Degradation; Dictionaries; Encoding; Fault diagnosis; Sequential circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 1996., Proceedings of 14th
Conference_Location :
Princeton, NJ
ISSN :
1093-0167
Print_ISBN :
0-8186-7304-4
Type :
conf
DOI :
10.1109/VTEST.1996.510854
Filename :
510854
Link To Document :
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