Title :
A Rigorous Analysis of Distributed Microwave Effects in Traveling Wave Photodetectors and Their Interconnections with Passive Microwave Transmission Lines
Author :
Pasalic, Dam ; Vahldieck, Rüdiger
Author_Institution :
Swiss Federal Institute of Technology, IFH, Gloriastrasse 35, CH-8092 Zurich, Switzerland. Tel: +41-1-632 4860, Fax: +41-1-632 1198, E-mail: dpasalic@ifh.ee.ethz.ch
Abstract :
A computationally efficient hybrid technique for rigorous analysis of TWPDs and their connections with the embedding microwave circuit is presented. The combination of a 2D drift-diffusion based semiconductor analysis method with a full-wave EM simulator allows the computation of slow wave factor and RF attenuation constant of the TWPD as functions of optical input power. In addition, the interconnection effects in terms of s-parameters between the TWPD and a passive CPW line using airbridge transition are presented.
Keywords :
Circuit analysis computing; Distributed parameter circuits; Embedded computing; Integrated circuit interconnections; Microwave circuits; Microwave theory and techniques; Optical attenuators; Photodetectors; Power transmission lines; Transmission lines;
Conference_Titel :
Microwave Conference, 2003 33rd European
Conference_Location :
Munich, Germany
Print_ISBN :
1-58053-834-7
DOI :
10.1109/EUMA.2003.340883
