DocumentCode
2219790
Title
On the diagnosis of programmable interconnect systems: Theory and application
Author
Huang, W.-K. ; Chen, X.T. ; Lombardi, F.
Author_Institution
Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
fYear
1996
fDate
28 Apr-1 May 1996
Firstpage
204
Lastpage
209
Abstract
This paper considers the diagnosis of field programmable interconnect systems (FPIS) in which programmable grids made of switches are included. For this type of interconnects, the number of times the grid must be programmed and the programming sequence of the switches an two of the most important figures of merit for full diagnosis (defection and location with no aliasing and confounding). A hierarchical approach to diagnosis is proposed and fully characterized. The application of this technique to commercially available FPIS such as FPGAs, is discussed. It is shown that the proposed diagnostic technique can be applied to the general purpose interconnect of the FPGAs in the 3000 family by Xilinx
Keywords
fault diagnosis; field programmable gate arrays; integrated circuit interconnections; logic testing; FPGA; FPIS; Xilinx 3000; diagnosis; field programmable interconnect system; switch grid; Application software; Bridges; Computer science; Fault detection; Field programmable gate arrays; Logic programming; Programmable logic arrays; Programmable logic devices; Switches; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1996., Proceedings of 14th
Conference_Location
Princeton, NJ
ISSN
1093-0167
Print_ISBN
0-8186-7304-4
Type
conf
DOI
10.1109/VTEST.1996.510859
Filename
510859
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