Title :
Initialization of sequential circuits and its application to ATPG
Author :
Wehbeh, Jalal A. ; Saab, Daniel G.
Author_Institution :
MIPS Technol. Inc., Mountain View, CA, USA
fDate :
28 Apr-1 May 1996
Abstract :
A general method for determining whether a certain design is initializable, and for generating its initialization sequence, is presented in this paper. This method is based on structural decomposition of the circuit, and can handle both logical (using X-value simulation) and functional initializability. The routines developed are then used for ATPG of sequential circuits
Keywords :
VLSI; automatic testing; integrated circuit testing; integrated logic circuits; logic testing; sequential circuits; ATPG; X-value simulation; functional initializability; initialization sequence; sequential circuits; structural decomposition; Automatic test pattern generation; Circuit faults; Circuit simulation; Equations; Flip-flops; Graphics; Hardware; Multivalued logic; Sequential circuits; Silicon;
Conference_Titel :
VLSI Test Symposium, 1996., Proceedings of 14th
Conference_Location :
Princeton, NJ
Print_ISBN :
0-8186-7304-4
DOI :
10.1109/VTEST.1996.510864
