DocumentCode
2219912
Title
Initialization of sequential circuits and its application to ATPG
Author
Wehbeh, Jalal A. ; Saab, Daniel G.
Author_Institution
MIPS Technol. Inc., Mountain View, CA, USA
fYear
1996
fDate
28 Apr-1 May 1996
Firstpage
246
Lastpage
251
Abstract
A general method for determining whether a certain design is initializable, and for generating its initialization sequence, is presented in this paper. This method is based on structural decomposition of the circuit, and can handle both logical (using X-value simulation) and functional initializability. The routines developed are then used for ATPG of sequential circuits
Keywords
VLSI; automatic testing; integrated circuit testing; integrated logic circuits; logic testing; sequential circuits; ATPG; X-value simulation; functional initializability; initialization sequence; sequential circuits; structural decomposition; Automatic test pattern generation; Circuit faults; Circuit simulation; Equations; Flip-flops; Graphics; Hardware; Multivalued logic; Sequential circuits; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1996., Proceedings of 14th
Conference_Location
Princeton, NJ
ISSN
1093-0167
Print_ISBN
0-8186-7304-4
Type
conf
DOI
10.1109/VTEST.1996.510864
Filename
510864
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