DocumentCode :
2220009
Title :
March LR: a test for realistic linked faults
Author :
van de Goor, A.J. ; Gaydadjiev, G.N. ; Mikitjuk, V.G. ; Yarmolik, V.N.
Author_Institution :
Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands
fYear :
1996
fDate :
28 Apr-1 May 1996
Firstpage :
272
Lastpage :
280
Abstract :
Many march tests have already been designed to cover faults of different fault models. The complexity of these tests arises when linked faults are taken into consideration. This paper gives an overview of the most important and commonly used fault models, including the industry´s popular disturb fault model. The fault coverage of march tests is analysed in a novel way, i.e., in terms of their detection capabilities for: simple faults, and linked faults; whereby the infinite class of linked faults has been reduced to a set of realistic linked faults. Thereafter the paper presents a methodology to design tests for realistic linked faults, resulting in the new tests March LR, March LRD and March LRDD. These new tests will be shown to be more efficient and to offer a higher fault coverage than comparable existing tests
Keywords :
fault diagnosis; integrated circuit testing; integrated memory circuits; March LR; March LRD; March LRDD; disturb faults; fault coverage; fault models; linked faults; march tests; semiconductor memories; Costs; Decoding; Design methodology; Fault detection; Informatics; Information technology; Marine vehicles; Production; Semiconductor device testing; Semiconductor memory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 1996., Proceedings of 14th
Conference_Location :
Princeton, NJ
ISSN :
1093-0167
Print_ISBN :
0-8186-7304-4
Type :
conf
DOI :
10.1109/VTEST.1996.510868
Filename :
510868
Link To Document :
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