A new test pattern generation method for delay fault testing

Importance of delay testing is growing especially for high speed circuits. As delay testing using automatic test equipment is expensive, built-in self-test is an alternative technique that can significantly reduce the cost of delay testing. In this paper a new test pattern generation method for the detection of delay faults is proposed. It can be seen as a directed random generation technique, and uses some original concepts from machine learning to generate delay fault detecting test pairs. First, a set of random test vectors is generated. Next, a learning tool working on those vectors provides relevant features of delay fault detecting test pairs. Finally, a set of new test vectors that are consistent with those features is generated. A comparison with other test generation techniques has been done on several circuits, and has shown the efficiency of our solution in terms of test sequence length and delay fault coverage