DocumentCode
2220149
Title
An algebraic method for delay fault testing
Author
CrÉpaux-motte, Sophie ; JACOMINO, Mireille ; David, René
Author_Institution
Lab. d´´Autom., Inst. Nat. Polytech. de Grenoble, St.-Martin-d´´Heres, France
fYear
1996
fDate
28 Apr-1 May 1996
Firstpage
308
Lastpage
315
Abstract
This paper presents an algebraic method allowing an accurate analysis of delay faults. This method is based on the fact that some input values remain constant when two successive input vectors are applied. For a transition between two input states, the output function is reduced to a function of few variables. An analysis of the reduced function allows one to obtain the delay faults which are detected by the corresponding transition. The analysis allows one to know if a fault is robustly testable or non robustly testable and validatable, or weakly verifiable: in every case the corresponding tests are obtained. An application of the results to random testing of faults allows one to observe that some non robustly testable faults are easier to detect than some robustly testable faults
Keywords
Markov processes; delays; fault diagnosis; logic testing; timing; algebraic method; delay fault testing; input values; input vectors; nonrobustly testable fault; output function; random testing; robustly testable fault; state transition; weakly verifiable; Circuit faults; Circuit testing; Clocks; Combinational circuits; Fault detection; Logic testing; Propagation delay; Robustness; System testing; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1996., Proceedings of 14th
Conference_Location
Princeton, NJ
ISSN
1093-0167
Print_ISBN
0-8186-7304-4
Type
conf
DOI
10.1109/VTEST.1996.510873
Filename
510873
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