• DocumentCode
    2220149
  • Title

    An algebraic method for delay fault testing

  • Author

    CrÉpaux-motte, Sophie ; JACOMINO, Mireille ; David, René

  • Author_Institution
    Lab. d´´Autom., Inst. Nat. Polytech. de Grenoble, St.-Martin-d´´Heres, France
  • fYear
    1996
  • fDate
    28 Apr-1 May 1996
  • Firstpage
    308
  • Lastpage
    315
  • Abstract
    This paper presents an algebraic method allowing an accurate analysis of delay faults. This method is based on the fact that some input values remain constant when two successive input vectors are applied. For a transition between two input states, the output function is reduced to a function of few variables. An analysis of the reduced function allows one to obtain the delay faults which are detected by the corresponding transition. The analysis allows one to know if a fault is robustly testable or non robustly testable and validatable, or weakly verifiable: in every case the corresponding tests are obtained. An application of the results to random testing of faults allows one to observe that some non robustly testable faults are easier to detect than some robustly testable faults
  • Keywords
    Markov processes; delays; fault diagnosis; logic testing; timing; algebraic method; delay fault testing; input values; input vectors; nonrobustly testable fault; output function; random testing; robustly testable fault; state transition; weakly verifiable; Circuit faults; Circuit testing; Clocks; Combinational circuits; Fault detection; Logic testing; Propagation delay; Robustness; System testing; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1996., Proceedings of 14th
  • Conference_Location
    Princeton, NJ
  • ISSN
    1093-0167
  • Print_ISBN
    0-8186-7304-4
  • Type

    conf

  • DOI
    10.1109/VTEST.1996.510873
  • Filename
    510873