Title :
Critical EMC test issues needing early resolution
Author :
White, Curtis B.
Author_Institution :
EMC Consultant 3945 Gray Fox Run, Rockford, Illinois, 61114, USA
Abstract :
EMC test programs are often very lengthy and expensive. It is very important to address a number of critical EMC test issues as early in the program as possible to ensure complete and accurate planning, budgeting and design criteria. This paper presents and discusses a number of typical critical EMC test issues needing early resolution in programs. Suggestions are also provided to help control the potential impact of these issues.
Keywords :
electromagnetic compatibility; planning; testing; EMC test issues; EMC test programs; budgeting; design criteria; early resolution; planning; Electromagnetic compatibility; IEEE Potentials; Laboratories; Schedules; Transient analysis; Wiring;
Conference_Titel :
Electromagnetic Compatibility (EMC), 2012 IEEE International Symposium on
Conference_Location :
Pittsburgh, PA
Print_ISBN :
978-1-4673-2061-0
DOI :
10.1109/ISEMC.2012.6351797
