Title :
Process identification by neuromorphic pattern recognition
Author :
Toh, Kar-Ann ; Devanathan, R.
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Inst., Singapore
Abstract :
A neural network based process identification technique using the pattern recognition approach is proposed in this paper. The closed loop process identification is treated as a static map between the controller parameters together with the observed response pattern parameters and the process dynamic parameters. Simulation study shows the feasibility of establishing such a map for online process identification
Keywords :
adaptive control; closed loop systems; identification; neural nets; pattern recognition; process control; self-adjusting systems; PID control; adaptive control; closed loop process; neural network; neuromorphic pattern recognition; process dynamic parameters; process identification; self tuning control; static map; Control systems; Neuromorphics; Neurons; Nonlinear control systems; Optimal control; PD control; Pattern recognition; Pi control; Proportional control; Three-term control;
Conference_Titel :
Industrial Electronics, Control, and Instrumentation, 1993. Proceedings of the IECON '93., International Conference on
Conference_Location :
Maui, HI
Print_ISBN :
0-7803-0891-3
DOI :
10.1109/IECON.1993.339054
