DocumentCode
2220418
Title
Multiple fault diagnosis using n-detection tests
Author
Wang, Zhiyuan ; Marek-Sadowska, Malgorzata ; Tsai, Kun-Han ; Rajski, Janusz
Author_Institution
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
fYear
2003
fDate
13-15 Oct. 2003
Firstpage
198
Lastpage
201
Abstract
We study the relationship between multiple fault diagnosability and fault detection count. Instead of developing a complex diagnostic algorithm for multiple fault behavior, we change the test sets used in test and diagnosis. This allows us to apply a simple single-fault based diagnostic algorithm, and yet achieve very good diagnosability for the failure test cases caused by multiple faults. We have verified experimentally the effectiveness of n-detection tests for multiple-fault cases and explained the results in probabilistic terms.
Keywords
automatic testing; fault diagnosis; multiple fault diagnosis; n-detection test; Bridge circuits; Change detection algorithms; Circuit faults; Circuit testing; Electrical fault detection; Failure analysis; Fault detection; Fault diagnosis; Manufacturing; Sequential analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Design, 2003. Proceedings. 21st International Conference on
ISSN
1063-6404
Print_ISBN
0-7695-2025-1
Type
conf
DOI
10.1109/ICCD.2003.1240895
Filename
1240895
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