Title :
Hybrid inverter circuits of nano-MOSFET and metallic-based SET
Author :
Cheng, J. ; Jiang, J.F. ; Cai, Q.Y.
Author_Institution :
Res. Inst. of Micro/Nano Sci. & Technol., Shanghai Jiao Tong Univ., China
Abstract :
In this paper, we give a novel choice of nanometer scale inverter. It is based on a nano-MOSFET as a drive transistor and a metallic-based SET (single electron transistor) as a load. The nano-MOSFET is assumed to have intrinsic silicon channel and metal source/drain. Applying a simple method based on ballistic transportation, the device characteristics can be determined. On the other hand, SET, the device operating on the principle of Coulomb blockade effects, can be realized on a metallic base. By connecting the SET gate to its source, we can treat it as a normal resistance. Our simulation proved the two devices cooperated very well and we got the ideal characteristics of this inverter. These results are then compared with another form of inverter that we presented previously, and we conclude the advantages of both circuits at the end of the paper.
Keywords :
Coulomb blockade; MOSFET; ballistic transport; circuit simulation; digital simulation; hybrid integrated circuits; invertors; nanoelectronics; single electron transistors; Coulomb blockade effects; Si; ballistic transport; device characteristics; ideal characteristics; intrinsic Si channel; metal source/drain; metallic-based single electron transistor load; nano-MOSFET drive transistor; nano-MOSFET/metallic-based SET hybrid inverter circuits; nanometer scale inverter; simulation; Circuit simulation; Electron emission; Equations; Inverters; Nanoscale devices; Schottky barriers; Silicon; Single electron transistors; Switches; Transportation;
Conference_Titel :
Solid-State and Integrated-Circuit Technology, 2001. Proceedings. 6th International Conference on
Print_ISBN :
0-7803-6520-8
DOI :
10.1109/ICSICT.2001.982160