DocumentCode :
2220474
Title :
Measurement Techniques For Microwave Device Characterization And Modelling
fYear :
1990
fDate :
23-23 April 1990
Keywords :
Calibration; Conferences; Measurement techniques; Microstrip; Microwave devices; Microwave measurements; Microwave theory and techniques; Optimization methods; Scattering parameters; USA Councils;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Measurement Techniques for Microwave Device Characterization and Modelling, 1990. Digest of Papers. 1990 Workshop on
Conference_Location :
Stuttgart, Germany
Type :
conf
DOI :
10.1109/MDCM.1990.666349
Filename :
666349
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2220474
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