Title :
Operation of a 3D nano-electron cell for logic and memory
Author :
Hu, C.H. ; Jiang, J.F. ; Cai, Q.Y.
Author_Institution :
Res. Inst. of Micro/Nano Sci. & Technol., Shanghai Jiao Tong Univ., China
Abstract :
In this paper, by exploring the negative differential conductance (NDC) of a resonant interband tunneling diode (RITD), e.g. InAs/AsSb/GaSb, and the interaction between metallic nano-dots, we present and demonstrate a theoretical model of a novel bi-stable and 4-stable operation on the basis of the three-dimensional (3D) nano-electron cell which consists of metallic nano-dots forming into compact and two-dimension (2D) arrays on the surface of RITDs. We present a simplified circuit model without considering single-electron effects between metallic nano-dots, where the RITD is described by a simplified physics-based model. We investigate numerical results for this 3D nano-electron cell and their dependence on the relevant parameters. At last calculations based on Monte Carlo simulation considering single-electron effects between metallic nano-dots demonstrate that our simplified model is comprehensive enough to describe this system in nature. The calculated results demonstrate it is promising for future nano-logic and nano-memory applications.
Keywords :
III-V semiconductors; Monte Carlo methods; arsenic compounds; digital simulation; gallium compounds; indium compounds; integrated logic circuits; integrated memory circuits; nanoelectronics; quantum dots; resonant tunnelling diodes; semiconductor device models; 3D nano-electron cell; 4-stable operation; InAs-AsSb-GaSb; InAs/AsSb/GaSb; Monte Carlo simulation; RITD; bistable operation; compact 2D arrays; metallic nano-dots; nano-logic applications; nano-memory applications; negative differential conductance; numerical results; resonant interband tunneling diode; simplified circuit model; simplified physics-based model; Capacitance; Diodes; Equations; Equivalent circuits; Logic; Nanoscale devices; Resonance; Shape measurement; Temperature; Tunneling;
Conference_Titel :
Solid-State and Integrated-Circuit Technology, 2001. Proceedings. 6th International Conference on
Print_ISBN :
0-7803-6520-8
DOI :
10.1109/ICSICT.2001.982162