DocumentCode :
2220589
Title :
Linear response model of Si single electron transistor
Author :
Zhou, S. ; Jiang, J.F. ; Cai, Q.Y.
Author_Institution :
Res. Inst. of Micro/Nano Sci. & Technol., Shanghai Jiao Tong Univ., China
Volume :
2
fYear :
2001
fDate :
22-25 Oct. 2001
Firstpage :
1411
Abstract :
A linear response model of a Si single electron transistor (Si-SET) is studied. The Coulomb island of the Si-SET with a discrete level spectrum is weakly coupled to two electron reservoirs via nanotunneling junction barriers. The reservoirs, named source and drain electrodes respectively, are taken to be in thermal equilibrium at temperature T and Fermi energy EF. The Si-SET is considered to be driven in linear response, i.e., the conductance G is defined as G = I/V in the limit V tends to 0. We analyze the conductance characteristics of the Si-SET, which make it possible to simulate circuit characteristics of the Si-SET from physical parameters.
Keywords :
Coulomb blockade; digital simulation; elemental semiconductors; semiconductor device models; silicon; single electron transistors; tunnelling; Coulomb island; Fermi energy; Si; Si-SET; circuit characteristics; conductance characteristics; discrete level spectrum; electron reservoirs; linear response model; nanotunneling junction barriers; simulation; single electron transistor; thermal equilibrium; Capacitance; Circuits; Electrodes; Magnetic tunneling; Quantum dots; Reservoirs; Silicon; Single electron transistors; Temperature; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated-Circuit Technology, 2001. Proceedings. 6th International Conference on
Print_ISBN :
0-7803-6520-8
Type :
conf
DOI :
10.1109/ICSICT.2001.982167
Filename :
982167
Link To Document :
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