DocumentCode
2220730
Title
Monitoring power dissipation for fault detection
Author
Vinnakota, Bapiraju
Author_Institution
Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
fYear
1996
fDate
28 Apr-1 May 1996
Firstpage
483
Lastpage
488
Abstract
In this paper, we suggest that the dynamic power dissipation of a circuit can be used to detect faults in it. The change in dissipation caused by a fault can be maximized by applying specific test vectors. For example circuits, we show that the power dissipation can be used to detect faults which do not affect static power dissipation. We also discuss how faults may be detected with a frequency domain analysis. In many cases, the Fourier spectra of the power supply currents in the good and faulty circuits will be very different. Power monitoring is also verified experimentally, for an example circuit
Keywords
CMOS integrated circuits; VLSI; fault location; frequency-domain analysis; integrated circuit testing; monitoring; CMOS IC testing; fault detection; frequency domain analysis; power dissipation; power monitoring; test vectors; Circuit faults; Circuit testing; Current supplies; Electrical fault detection; Energy consumption; Fault detection; Monitoring; Power dissipation; Power supplies; Pulsed power supplies;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1996., Proceedings of 14th
Conference_Location
Princeton, NJ
ISSN
1093-0167
Print_ISBN
0-8186-7304-4
Type
conf
DOI
10.1109/VTEST.1996.510897
Filename
510897
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