Title :
Monitoring power dissipation for fault detection
Author :
Vinnakota, Bapiraju
Author_Institution :
Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
fDate :
28 Apr-1 May 1996
Abstract :
In this paper, we suggest that the dynamic power dissipation of a circuit can be used to detect faults in it. The change in dissipation caused by a fault can be maximized by applying specific test vectors. For example circuits, we show that the power dissipation can be used to detect faults which do not affect static power dissipation. We also discuss how faults may be detected with a frequency domain analysis. In many cases, the Fourier spectra of the power supply currents in the good and faulty circuits will be very different. Power monitoring is also verified experimentally, for an example circuit
Keywords :
CMOS integrated circuits; VLSI; fault location; frequency-domain analysis; integrated circuit testing; monitoring; CMOS IC testing; fault detection; frequency domain analysis; power dissipation; power monitoring; test vectors; Circuit faults; Circuit testing; Current supplies; Electrical fault detection; Energy consumption; Fault detection; Monitoring; Power dissipation; Power supplies; Pulsed power supplies;
Conference_Titel :
VLSI Test Symposium, 1996., Proceedings of 14th
Conference_Location :
Princeton, NJ
Print_ISBN :
0-8186-7304-4
DOI :
10.1109/VTEST.1996.510897