• DocumentCode
    2220730
  • Title

    Monitoring power dissipation for fault detection

  • Author

    Vinnakota, Bapiraju

  • Author_Institution
    Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
  • fYear
    1996
  • fDate
    28 Apr-1 May 1996
  • Firstpage
    483
  • Lastpage
    488
  • Abstract
    In this paper, we suggest that the dynamic power dissipation of a circuit can be used to detect faults in it. The change in dissipation caused by a fault can be maximized by applying specific test vectors. For example circuits, we show that the power dissipation can be used to detect faults which do not affect static power dissipation. We also discuss how faults may be detected with a frequency domain analysis. In many cases, the Fourier spectra of the power supply currents in the good and faulty circuits will be very different. Power monitoring is also verified experimentally, for an example circuit
  • Keywords
    CMOS integrated circuits; VLSI; fault location; frequency-domain analysis; integrated circuit testing; monitoring; CMOS IC testing; fault detection; frequency domain analysis; power dissipation; power monitoring; test vectors; Circuit faults; Circuit testing; Current supplies; Electrical fault detection; Energy consumption; Fault detection; Monitoring; Power dissipation; Power supplies; Pulsed power supplies;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1996., Proceedings of 14th
  • Conference_Location
    Princeton, NJ
  • ISSN
    1093-0167
  • Print_ISBN
    0-8186-7304-4
  • Type

    conf

  • DOI
    10.1109/VTEST.1996.510897
  • Filename
    510897