DocumentCode

2220769

Title

S-parameter Measurements In The Microstrip Environment - The Hard Way

Author

Martin, M.

Author_Institution

Hahn-Meitner-Institut, Berlin

fYear

1990

fDate

23-23 April 1990

Firstpage

1

Lastpage

21

Keywords

Bandwidth; FETs; Fixtures; Gallium arsenide; Impedance; Inductance; Microstrip; Pulse amplifiers; Scattering parameters; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Measurement Techniques for Microwave Device Characterization and Modelling, 1990. Digest of Papers. 1990 Workshop on

Conference_Location

Stuttgart, Germany

Type

conf

DOI

10.1109/MDCM.1990.666350

Filename

666350