DocumentCode :
2220832
Title :
Author index
fYear :
1996
fDate :
April 28 1996-May 1 1996
Firstpage :
508
Abstract :
The author index contains an entry for each author and coauthor included in the proceedings record.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 1996., Proceedings of 14th
Conference_Location :
Princeton, NJ, USA
ISSN :
1093-0167
Print_ISBN :
0-8186-7304-4
Type :
conf
DOI :
10.1109/VTEST.1996.510900
Filename :
510900
Link To Document :
بازگشت