DocumentCode
2220988
Title
About the correlation between magnitudes of far and near field diffracted by screen on the plane interface of dielectric media
Author
Kuryliak, D.B. ; Nazarchuk, Z.T. ; Voytko, M.V.
Author_Institution
Karpenko Physico-Mech. Inst., Nat. Acad. of Sci. of Ukraine, Lviv, Ukraine
fYear
2009
fDate
21-24 Sept. 2009
Firstpage
107
Lastpage
108
Abstract
The problem of plane wave diffraction by semi-infinite metallic screen on the plane interface of dielectric media is solved using the Wiener-Hopf technique and expressions to determine the near and far field are received. Basing on this, the presentation of the near field magnitude (NFM) via far diffracted field in the plane normal to the screen edge is found. Also it is shown, that the ratio of the NFM at the different sounding angles or frequencies are proportional to the ratio of corresponding far scattered fields.
Keywords
electromagnetic wave diffraction; electromagnetic wave scattering; integral equations; Wiener-Hopf technique; dielectric media; far field diffraction; far field scattering; near field diffraction; near field magnitude; plane wave diffraction; semiinfinite metallic screen; Acoustic scattering; Dielectrics; Electromagnetic diffraction; Electromagnetic scattering; Electromagnetic wave polarization; Frequency; Reflection; Tellurium; Time factors;
fLanguage
English
Publisher
ieee
Conference_Titel
Direct and Inverse Problems of Electromagnetic and Acoustic Wave Theory, 2009. DIPED 2009. International Seminar/Workshop on
Conference_Location
Lviv
Print_ISBN
978-1-4244-4201-0
Type
conf
DOI
10.1109/DIPED.2009.5306974
Filename
5306974
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