• DocumentCode
    2221127
  • Title

    Recoverable user-level mutual exclusion

  • Author

    Bohannon, Philip ; Lieuwen, Daniel ; Silberschatz, Avi ; Sudarshan, S. ; Gava, Jacques

  • Author_Institution
    AT&T Bell Labs., Murray Hill, NJ, USA
  • fYear
    1995
  • fDate
    25-28 Oct 1995
  • Firstpage
    293
  • Lastpage
    301
  • Abstract
    Mutual exclusion primitives based on user-level atomic instructions (often called spin locks) have proven to be much more efficient than operating-system semaphores in situations where the contention on the semaphore is low. However, many of these spin lock schemes do not permit registration of ownership to be carried aut atomically with acquisition, potentially leaving the ownership undetermined if a process dies (or makes very slow progress) at a critical point in the registration code. We present an algorithm which can ensure the successful registration of ownership of a spin lock, regardless of where processes fail. Thus, our spin lock implementation is `recoverable´. The determination of a spin lock´s ownership can potentially be used to restore resources protected by the spin lock to consistency and then release the spin lock. Other processes using the lock can then continue to function normally, improving fault resiliency for the application. Our algorithm provides very fast lock acquisition when the acquisition is uncontested (comparable in speed to a simple test-and-set based spin lock), and we prove it works even on the weak memory consistency models implemented by many modern multiprocessor computer systems
  • Keywords
    concurrency control; operating systems (computers); fault resiliency; multiprocessor computer systems; mutual exclusion; operating-system semaphores; recoverable; spin locks; Concurrent computing; Costs; Hardware; Kernel; Operating systems; Performance evaluation; Protection; Sleep; Switches; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Parallel and Distributed Processing, 1995. Proceedings. Seventh IEEE Symposium on
  • Conference_Location
    San Antonio, TX
  • ISSN
    1063-6374
  • Print_ISBN
    0-81867195-5
  • Type

    conf

  • DOI
    10.1109/SPDP.1995.530698
  • Filename
    530698