Title :
Bottleneck adjacent matching 3 (BAM3) heuristic for re-entrant flow shop with dominant machine
Author :
Bareduan, S.A. ; Hasan, S.H.
Author_Institution :
Fac. of Mech. & Manuf. Eng., Univ. Tun Hussein Onn Malaysia, Batu Pahat, Malaysia
Abstract :
This paper presents a scheduling heuristic to minimize the makespan of a re-entrant flow shop using bottleneck analysis. The heuristic is specifically intended for the cyber manufacturing centre (CMC) which is an Internet-based collaborative design and manufacturing between the Universiti Tun Hussein Onn Malaysia and the small and medium enterprises. The CMC processes scheduling resembles a four machine permutation re-entrant flow shop with the process routing of M1,M2,M3,M4,M3,M4 in which the first process at M1 has high tendency of exhibiting dominant characteristic. It was shown that using bottleneck-based analysis, an effective constructive heuristic can be developed to solve for near-optimal scheduling sequence. At strong machine dominance level and medium to high job numbers, this heuristic shows slightly better makespan performance compared to the NEH. However, for smaller job numbers, NEH is superior.
Keywords :
CAD; computer aided manufacturing; flow shop scheduling; groupware; production engineering computing; Internet-based collaborative design; Internet-based collaborative manufacturing; bottleneck adjacent matching; bottleneck analysis; cyber manufacturing centre; dominant machine; machine permutation re-entrant flow shop; medium enterprises; process routing; scheduling heuristic; small enterprises; Collaboration; Computer aided manufacturing; Computer numerical control; Heuristic algorithms; Internet; Job shop scheduling; Manufacturing processes; Processor scheduling; Routing; Scheduling algorithm; Bottleneck; Scheduling; dominant machine; heuristic; re-entrant flow shop;
Conference_Titel :
Industrial Engineering and Engineering Management, 2008. IEEM 2008. IEEE International Conference on
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-2629-4
Electronic_ISBN :
978-1-4244-2630-0
DOI :
10.1109/IEEM.2008.4737848