Title :
Nonlinear macromodels of large coupled interconnect networks
Author :
Franzini, B. ; Forzan, C. ; Pandini, D. ; Liu, Y. ; Guardiani, C.
Author_Institution :
Dept. of Adv. Res., SGS-Thomson Microelectron., Agrate Brianza, Italy
Abstract :
A macromodel of the crosstalk effects between adjacent interconnects that takes into account the driver nonlinear behavior is presented in this paper. The macromodel is obtained by combining a reduced order representation of the equivalent impedance with coupling seen at each driver output with a network order reduction based macromodel of the overall linear interconnect network. The effectiveness of the proposed methodology is demonstrated with the analysis of the crosstalk effects on a 0.25 μm, high density, CMOS technology
Keywords :
CMOS logic circuits; crosstalk; high-speed integrated circuits; integrated circuit interconnections; integrated circuit modelling; 0.25 micron; CMOS technology; adjacent interconnects; coupled interconnect networks; crosstalk effects; driver nonlinear behavior; equivalent impedance; high-speed logic circuits; network order reduction based macromodel; nonlinear macromodels; overall linear interconnect network; reduced order representation; CMOS technology; Capacitance; Coupling circuits; Crosstalk; Delay effects; Driver circuits; Equations; Impedance; Integrated circuit interconnections; Semiconductor device modeling;
Conference_Titel :
Custom Integrated Circuits Conference, 1998. Proceedings of the IEEE 1998
Conference_Location :
Santa Clara, CA
Print_ISBN :
0-7803-4292-5
DOI :
10.1109/CICC.1998.694963
