• DocumentCode
    2222182
  • Title

    High-frequency application of MOS compact models and their development for scalable RF model libraries

  • Author

    Pehlke, D.R. ; Schröter, M. ; Burstein, A. ; Matloubian, M. ; Chang, M.F.

  • Author_Institution
    Sci. Center, Rockwell Int. Corp., Thousand Oaks, CA, USA
  • fYear
    1998
  • fDate
    11-14 May 1998
  • Firstpage
    219
  • Lastpage
    222
  • Abstract
    The evaluation of MOS compact models, focusing on BSIM3v3, is performed with specific development described toward scalable RF libraries suitable for high-frequency mixed-signal circuit design. Additional parasitic elements are added to the compact model to better describe its operation at higher frequency. This extrinsic subcircuit includes the gate resistance and complex substrate admittance which are scalable and physically based, and a detailed parameter extraction procedure for each is described. Small-signal y-parameters and noise behavior of the extended model are used to verify the match to high-frequency on-wafer measurements
  • Keywords
    CMOS integrated circuits; MOSFET; UHF field effect transistors; UHF integrated circuits; field effect MMIC; integrated circuit design; integrated circuit modelling; integrated circuit noise; microwave field effect transistors; mixed analogue-digital integrated circuits; semiconductor device models; semiconductor device noise; BSIM3v3; HF mixed-signal circuit design; MOS compact models; complex substrate admittance; extrinsic subcircuit; gate resistance; high-frequency application; noise behavior; parameter extraction procedure; parasitic elements; scalable RF model libraries; small-signal y-parameters; Admittance; CMOS process; Capacitance; Circuit synthesis; Electrical resistance measurement; Integrated circuit modeling; Libraries; Parameter extraction; Radio frequency; Semiconductor device modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 1998. Proceedings of the IEEE 1998
  • Conference_Location
    Santa Clara, CA
  • Print_ISBN
    0-7803-4292-5
  • Type

    conf

  • DOI
    10.1109/CICC.1998.694967
  • Filename
    694967