Quantum ellipsometry

Author

Toussaint ; Abouraddy ; Sergienko, Alexander V. ; Saleh, B.E.A. ; Teich

Author_Institution

Quantum Imaging Lab., Boston Univ., MA, USA

fYear

2002

fDate

19-24 May 2002

Firstpage

31

Abstract

Summary form only given. We show that, by employing entangled-photon pairs that are generated by type II spontaneous parametric down-conversion (SPDC) in a non-collinear configuration, one can obtain absolute ellipsometric data from a reflective sample. The underlying physics that permits such ellipsometric measurements resides in the fact that fourth-order (coincidence) quantum interference of the photon pairs, in conjunction with polarization entanglement, emulates an idealized classical ellipsometric setup that utilizes a source and a detector that are both calibrated absolutely.

Keywords

calibration; ellipsometry; optical frequency conversion; quantum interference phenomena; quantum optics; absolute ellipsometric data; calibrated absolutely; classical ellipsometric setup; coincidence quantum interference; detector; ellipsometric measurements; entangled-photon pairs; fourth-order quantum interference; noncollinear configuration; photon pairs; polarization entanglement; source; spontaneous parametric down-conversion; Calibration; Ellipsometry; Optical frequency conversion;

fLanguage

English

Publisher

ieee

Conference_Titel

Quantum Electronics and Laser Science Conference, 2002. QELS '02. Technical Digest. Summaries of Papers Presented at the

Conference_Location

Long Beach, CA, USA

Print_ISBN

1-55752-708-3

Type

conf

DOI

10.1109/QELS.2002.1031046

Filename

1031046