• DocumentCode
    2222331
  • Title

    Characteristics of E-field near indirect ESD events

  • Author

    Iwata, Hiroyuki ; Akao, Yasuo

  • Author_Institution
    Dept. of Inf. Network Eng., Aichi Inst. of Technol., Japan
  • fYear
    1993
  • fDate
    9-13 Aug 1993
  • Firstpage
    26
  • Lastpage
    27
  • Abstract
    In the indirect electrostatic discharge (ESD) event, the shape of electromagnetic pulse due to discharge is important for estimating the performance degradation of electronic equipment. The pulse shape of the electric field was observed in the proximity of a conductor plate at which contact discharge was taking place. The results show that the pulse shape is affected by the location of both the discharge point and the connection point of the current-return cable. The results indicate that the immunity test for the indirect ESD should be done varying the point and direction of discharge
  • Keywords
    electric field measurement; electromagnetic pulse; electronic equipment testing; electrostatic discharge; E-field; EMP shape; conductor plate; connection point; current-return cable; discharge point; electric field; electromagnetic pulse; electronic equipment; electrostatic discharge; immunity test; indirect ESD events; performance degradation; Conductors; Degradation; Electronic equipment; Electrostatic discharge; Fault location; IEC standards; Power cables; Pulse shaping methods; Shape; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1993. Symposium Record., 1993 IEEE International Symposium on
  • Conference_Location
    Dallas, TX
  • Print_ISBN
    0-7803-1304-6
  • Type

    conf

  • DOI
    10.1109/ISEMC.1993.473787
  • Filename
    473787