Title :
Second harmonic spectroscopy of two-dimensional Si nanocrystal layers
Author :
Jiang, Yizhang ; Downer, M.C.
Author_Institution :
Dept. of Phys., Texas Univ., Austin, TX, USA
Abstract :
Summary form only given. We report new measurements of SHG in reflection from two-dimensional (2D) layers of Si nanocrystals embedded in the ultrathin (<10 nm) oxide of a Si[001] wafer by a chemical vapor deposition process.
Keywords :
elemental semiconductors; interface states; nanoparticles; optical harmonic generation; photoluminescence; silicon; SHG in reflection; Si-SiO/sub 2/; azimuthal sample orientation; chirp-dependence; interface electronic structure; interface states; laser-driven charge transfer; photoluminescence; polarisation configuration; second harmonic spectroscopy; time-dependent SHG; two-dimensional nanocrystal layers; ultrathin oxide embedded layers; Interface phenomena; Optical frequency conversion; Photoluminescence; Silicon;
Conference_Titel :
Quantum Electronics and Laser Science Conference, 2002. QELS '02. Technical Digest. Summaries of Papers Presented at the
Conference_Location :
Long Beach, CA, USA
Print_ISBN :
1-55752-708-3
DOI :
10.1109/QELS.2002.1031055
