DocumentCode :
2222502
Title :
Blind recovery of transparent and semireflected scenes
Author :
Schechner, Yoav Y. ; Kiryat, Nahum ; Shamir, Joseph
Author_Institution :
Dept. of Electr. Eng., Technion-Israel Inst. of Technol., Haifa, Israel
Volume :
1
fYear :
2000
fDate :
2000
Firstpage :
38
Abstract :
We present a method to recover scenes deteriorated by superposition of transparent and semi-reflected contributions, as appear in reflections of windows. Separating the superimposed contributions from the images in which either contribution is in focus is based on mutual blurring and subtraction of the perturbing components. This procedure requires the defocus blur kernels to be known. The use of uncalibrated kernels had previously led to contaminated results. We propose a method for self-calibration of the blur kernels from the raw images themselves. The kernels are sought to minimize the mutual information of the recovered layers. This relaxes the need for prior knowledge on the optical transfer function. Experimental results are presented
Keywords :
calibration; computer vision; optical transfer function; blind recovery; defocus blur kernels; mutual blurring; optical transfer function; raw images; self calibration; semireflected scenes; transparent scenes; uncalibrated kernels; Calibration; Electrical capacitance tomography; Focusing; Frequency; Kernel; Layout; Microscopy; Mutual information; Optical imaging; Polarization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition, 2000. Proceedings. IEEE Conference on
Conference_Location :
Hilton Head Island, SC
ISSN :
1063-6919
Print_ISBN :
0-7695-0662-3
Type :
conf
DOI :
10.1109/CVPR.2000.855796
Filename :
855796
Link To Document :
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