• DocumentCode
    2222502
  • Title

    Blind recovery of transparent and semireflected scenes

  • Author

    Schechner, Yoav Y. ; Kiryat, Nahum ; Shamir, Joseph

  • Author_Institution
    Dept. of Electr. Eng., Technion-Israel Inst. of Technol., Haifa, Israel
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    38
  • Abstract
    We present a method to recover scenes deteriorated by superposition of transparent and semi-reflected contributions, as appear in reflections of windows. Separating the superimposed contributions from the images in which either contribution is in focus is based on mutual blurring and subtraction of the perturbing components. This procedure requires the defocus blur kernels to be known. The use of uncalibrated kernels had previously led to contaminated results. We propose a method for self-calibration of the blur kernels from the raw images themselves. The kernels are sought to minimize the mutual information of the recovered layers. This relaxes the need for prior knowledge on the optical transfer function. Experimental results are presented
  • Keywords
    calibration; computer vision; optical transfer function; blind recovery; defocus blur kernels; mutual blurring; optical transfer function; raw images; self calibration; semireflected scenes; transparent scenes; uncalibrated kernels; Calibration; Electrical capacitance tomography; Focusing; Frequency; Kernel; Layout; Microscopy; Mutual information; Optical imaging; Polarization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition, 2000. Proceedings. IEEE Conference on
  • Conference_Location
    Hilton Head Island, SC
  • ISSN
    1063-6919
  • Print_ISBN
    0-7695-0662-3
  • Type

    conf

  • DOI
    10.1109/CVPR.2000.855796
  • Filename
    855796