Title :
Near-field Raman spectroscopy using a sharp metal tip
Author :
Hartschuh, A. ; Novotny, L.
Author_Institution :
Inst. of Opt., Rochester Univ., NY, USA
Abstract :
Summary form only given. Combined with near-field techniques, Raman spectroscopy is a promising tool for identifying and analyzing the molecular composition of complex materials, providing spatially resolved chemical maps with nanoscale resolution. Basic drawback of Raman methods is the comparatively low scattering cross-section precluding the detection of single scatterers. However, this drawback can be overcome using surface enhanced Raman scattering (SERS). SERS is shown to provide enormous enhancement allowing for Raman spectroscopy even on the single molecule level.
Keywords :
Raman spectroscopy; near-field scanning optical microscopy; surface enhanced Raman scattering; SERS; complex molecular structures; enhancement factors; focused Hermite-Gaussian beam; longitudinal electric field; nanoscale resolution; near-field Raman spectroscopy; sharp metal tip; single molecule level; single-wall carbon nanotubes; tip-particle configuration; Raman spectroscopy;
Conference_Titel :
Quantum Electronics and Laser Science Conference, 2002. QELS '02. Technical Digest. Summaries of Papers Presented at the
Conference_Location :
Long Beach, CA, USA
Print_ISBN :
1-55752-708-3
DOI :
10.1109/QELS.2002.1031058
