Near-field Raman spectroscopy using a sharp metal tip

Author

Hartschuh, A. ; Novotny, L.

Author_Institution

Inst. of Opt., Rochester Univ., NY, USA

fYear

2002

fDate

19-24 May 2002

Firstpage

39

Lastpage

40

Abstract

Summary form only given. Combined with near-field techniques, Raman spectroscopy is a promising tool for identifying and analyzing the molecular composition of complex materials, providing spatially resolved chemical maps with nanoscale resolution. Basic drawback of Raman methods is the comparatively low scattering cross-section precluding the detection of single scatterers. However, this drawback can be overcome using surface enhanced Raman scattering (SERS). SERS is shown to provide enormous enhancement allowing for Raman spectroscopy even on the single molecule level.

Keywords

Raman spectroscopy; near-field scanning optical microscopy; surface enhanced Raman scattering; SERS; complex molecular structures; enhancement factors; focused Hermite-Gaussian beam; longitudinal electric field; nanoscale resolution; near-field Raman spectroscopy; sharp metal tip; single molecule level; single-wall carbon nanotubes; tip-particle configuration; Raman spectroscopy;

fLanguage

English

Publisher

ieee

Conference_Titel

Quantum Electronics and Laser Science Conference, 2002. QELS '02. Technical Digest. Summaries of Papers Presented at the

Conference_Location

Long Beach, CA, USA

Print_ISBN

1-55752-708-3

Type

conf

DOI

10.1109/QELS.2002.1031058

Filename

1031058