Title :
Identification of differentially expressed genes for diabetes with parental history vs healthy using Microarray data analysis
Author :
Sekhar, V.C. ; Rao, Allam Appa ; Rao, Srinivasa P. ; Srinivas, K.
Author_Institution :
SRKR Eng. Coll., Bhimavaram, India
Abstract :
Both environmental and genetic factors have roles in the development of any disease. A genetic disorder in a disease is caused by abnormalities in an individual´s genetic material (genome). The quest for an understanding of how genetic factors contribute to human disease is gathering speed. Differential gene expression analysis plays an important role for the study of genetic factors causing diseases. We proposed a method for identifying differentially expressed genes causing Type-2 diabetes mellitus using micro array data for diabetes with parental history and healthy. This method focuses on identifying multivariate and univariate outliers using Mahalanobis Distance, Minimum Co-variance Determinant (MCD) and other statistical methods. This method is applied on microarray data from two samples one from diabetes with parental history and the other from healthy and identified 1579 genes which are differentially expressed. Prior to analysis, the micro array data is normalized using Loess Normalization method.
Keywords :
biology computing; covariance analysis; data analysis; diseases; genetics; medical disorders; Loess normalization method; MCD; Mahalanobis distance; differential gene expression analysis; differentially expressed genes; environmental factors; genetic disorder; genetic factors causing diseases; genetic material; genome; healthy genes; human disease; microarray data analysis; minimum covariance determinant; multivariate outliers; parental history; statistical methods; type-2 diabetes mellitus; univariate outliers; Adaptation model; Bioinformatics; Book reviews; Genomics; Robots; Silicon compounds; Mahalanobis Distance; Type-2 Diabetes mellitus; differential gene expression; genome; outliers;
Conference_Titel :
Advanced Computer Theory and Engineering (ICACTE), 2010 3rd International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-6539-2
DOI :
10.1109/ICACTE.2010.5579318