DocumentCode :
2222840
Title :
Determination of Noise Parameters
Author :
Dambrine, G. ; Cappy, A. ; Guillerme, Y.
fYear :
1990
fDate :
23-23 April 1990
Firstpage :
128
Lastpage :
156
Keywords :
Circuit noise; HEMTs; Inductance; Integrated circuit modeling; Integrated circuit noise; MESFETs; Millimeter wave circuits; Millimeter wave measurements; Noise measurement; Semiconductor device measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Measurement Techniques for Microwave Device Characterization and Modelling, 1990. Digest of Papers. 1990 Workshop on
Conference_Location :
Stuttgart, Germany
Type :
conf
DOI :
10.1109/MDCM.1990.666358
Filename :
666358
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2222840
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