• DocumentCode
    2222840
  • Title

    Determination of Noise Parameters

  • Author

    Dambrine, G. ; Cappy, A. ; Guillerme, Y.

  • fYear
    1990
  • fDate
    23-23 April 1990
  • Firstpage
    128
  • Lastpage
    156
  • Keywords
    Circuit noise; HEMTs; Inductance; Integrated circuit modeling; Integrated circuit noise; MESFETs; Millimeter wave circuits; Millimeter wave measurements; Noise measurement; Semiconductor device measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Measurement Techniques for Microwave Device Characterization and Modelling, 1990. Digest of Papers. 1990 Workshop on
  • Conference_Location
    Stuttgart, Germany
  • Type

    conf

  • DOI
    10.1109/MDCM.1990.666358
  • Filename
    666358
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2222840