Title :
In-Fixture Measurements with Modern Network Analyzers
Author_Institution :
Hewlett-Packard, Network Measurements Division
Keywords :
Bridge circuits; Circuit testing; Fixtures; Frequency; Integrated circuit testing; Microwave devices; Microwave measurements; Packaging; Probes; System testing;
Conference_Titel :
Measurement Techniques for Microwave Device Characterization and Modelling, 1990. Digest of Papers. 1990 Workshop on
Conference_Location :
Stuttgart, Germany
DOI :
10.1109/MDCM.1990.666360