DocumentCode :
2223139
Title :
New investigation on pseudospark discharge and quenching phenomenon at zero current
Author :
Bauville, G. ; Bendiab, F. ; Meslem, Y. ; Delmas, A.
Author_Institution :
Lab. de Phys. des Gaz et des Plasmas, Univ. de Paris-Sud, Orsay, France
Volume :
2
fYear :
1996
fDate :
21-26 Jul 1996
Firstpage :
991
Abstract :
These studies, carried out on the pseudospark discharge, show its high ability to open a circuit at zero current. The interesting results are linked to the diffuse discharge mode, and allow avoidance of the development of anodic spots at high peak current above 40 kA. In these experiments, after a pulse current of 18 kA and 225 μs duration, the rate of reapplied voltage is 18 kV/μs and the peak of withstand voltage is 18 kV. This ability depends strongly on the electrode conditioning. The authors obtained the best results with a number of shots up to 200 and a rate current lower than 2108 A/s. They believe that the values of the rate of current at zero current (conduction phase) have a great influence on the opening switch performance. They investigate other characteristics, such as the dimensions of the cavities, the hole diameter, the gap and the pressure, in order to increase performance. A CCD camera allows investigation of the conduction phase and the recovery phase before and after zero current crossing
Keywords :
electric breakdown; electrodes; spark gaps; sparks; switchgear testing; vacuum breakdown; vacuum interrupters; 18 kA; 18 kV; 225 mus; CCD camera; cavity dimensions; conduction phase; diffuse discharge mode; electrode conditioning; gap; hole diameter; opening switch performance; pressure; pseudospark discharge; pulse current; quenching phenomenon; recovery phase; withstand voltage; zero current crossing; Charge coupled devices; Charge-coupled image sensors; Circuit testing; Delay; Electrodes; Plasmas; Pulse circuits; Switched capacitor circuits; Switches; Zero voltage switching;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Discharges and Electrical Insulation in Vacuum, 1996. Proceedings. ISDEIV., XVIIth International Symposium on
Conference_Location :
Berkeley, CA
Print_ISBN :
0-7803-2906-6
Type :
conf
DOI :
10.1109/DEIV.1996.545514
Filename :
545514
Link To Document :
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