Title :
Face recognition by distribution specific feature extraction
Author_Institution :
Matsushita Electr. Ind. Co. Ltd., Kawasaki, Japan
Abstract :
A new pattern recognition approach to face recognition is presented that can deal with drastic differences in the appearance of a face. Given a pair of sample sets of facial images with potential correspondences, each being drawn from a distinctive distribution, the algorithm reliability finds correspondences over those different distributions. Unlike the traditional approaches that model the face images as having a consistent distribution and so use the same feature extraction function for both of the image sets, the new method applies to each sample a function specific to the distribution from which it is drawn. This function is derived by maximizing a newly defined class-separability criterion over the different distributions. Results of face recognition are presented on images including drivers´ license pictures. Drastic improvements are shown over algorithms based on the traditional Fisher´s discriminant analysis
Keywords :
face recognition; feature extraction; face recognition; facial images; feature extraction; Face recognition; Feature extraction;
Conference_Titel :
Computer Vision and Pattern Recognition, 2000. Proceedings. IEEE Conference on
Conference_Location :
Hilton Head Island, SC
Print_ISBN :
0-7695-0662-3
DOI :
10.1109/CVPR.2000.855830