• DocumentCode
    2223300
  • Title

    Structural coherence of problem and algorithm: An analysis for EDAs on all 2-bit and 3-bit problems

  • Author

    Brownlee, Alexander E.I. ; McCall, John A.W. ; Christie, Lee A.

  • Author_Institution
    Division of Computing Science and Mathematics, University of Stirling, Stirling, UK
  • fYear
    2015
  • fDate
    25-28 May 2015
  • Firstpage
    2066
  • Lastpage
    2073
  • Abstract
    Metaheuristics assume some kind of coherence between decision and objective spaces. Estimation of Distribution algorithms approach this by constructing an explicit probabilistic model of high fitness solutions, the structure of which is intended to reflect the structure of the problem. In this context, “structure” means the dependencies or interactions between problem variables in a probabilistic graphical model. There are many approaches to discovering these dependencies, and existing work has already shown that often these approaches discover “unnecessary” elements of structure — that is, elements which are not needed to correctly rank solutions. This work performs an exhaustive analysis of all 2 and 3 bit problems, grouped into classes based on mononotic invariance. It is shown in [1] that each class has a minimal Walsh structure that can be used to solve the problem. We compare the structure discovered by different structure learning approaches to the minimal Walsh structure for each class, with summaries of which interactions are (in)correctly identified. Our analysis reveals a large number of symmetries that may be used to simplify problem solving. We show that negative selection can result in improved coherence between discovered and necessary structure, and conclude with some directions for a general programme of study building on this work.
  • Keywords
    Coherence; Couplings; Graphical models; Probabilistic logic; Search problems; Sociology; Statistics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Evolutionary Computation (CEC), 2015 IEEE Congress on
  • Conference_Location
    Sendai, Japan
  • Type

    conf

  • DOI
    10.1109/CEC.2015.7257139
  • Filename
    7257139