DocumentCode :
2223638
Title :
Optimal preventive maintenance for a device submitted to random and deteriorating failures
Author :
Bao, Han ; Jaishankar, Deepa
Author_Institution :
Dept. of Mech. Eng., Old Dominion Univ., Norfolk, VA, USA
fYear :
2008
fDate :
8-11 Dec. 2008
Firstpage :
491
Lastpage :
495
Abstract :
A Markov model is used to characterize the performance of a continuously operating device that is subject to random failure as well as failure generated by deterioration. The optimum preventive maintenance of this device is determined by maximizing its availability with respect to the mean time to minimal preventive maintenance. An example is provided to illustrate the method. The computational work is performed through Matlab® software. The results indicate that, as deterioration rate decreases, availability increases and total cost of maintenance decreases, but the respective increase/decrease occurs in a non-linear way. On the other hand, as random failure rate decreases the respective increase in availability and decrease in total cost of maintenance occurs in almost a linear way. Thus it is concluded that preventive maintenance is more sensitive to the range of deterioration failure rates than that of random failure rates.
Keywords :
Markov processes; mathematics computing; mechanical engineering computing; preventive maintenance; Markov model; Matlab software; deteriorating failures; optimal preventive maintenance; random failures; Availability; Character generation; Computer languages; Costs; Hazards; Markov processes; Mathematical model; Mechanical engineering; Preventive maintenance; Software performance; Deterioration failures; Markov Process; Optimal preventive maintenance; Optimal scheduling of maintenance; Random failures;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Engineering and Engineering Management, 2008. IEEM 2008. IEEE International Conference on
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-2629-4
Electronic_ISBN :
978-1-4244-2630-0
Type :
conf
DOI :
10.1109/IEEM.2008.4737917
Filename :
4737917
Link To Document :
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